25.1.5
SystemCapture
Release Date: 07/31/2026
Real-Time License Availability in Product Selection
The Product Choices dialog now displays real-time license availability directly next to each license name. This allows users to view the number of available licenses before launching and select the one that is most appropriate, enabling informed selections and reducing launch failures. Additionally, a new Refresh License icon updates the license availability without relaunching the application.
The Cut and Undo Cut options in the Artwork Control Form window can now be used to remove and restore selected item film layers in a single action. When multiple film layers are selected under the Film Control tab, right-clicking any one of them and choosing the Cut option removes all selected layers at once, and selecting the Undo Cut option restores all of them in a single operation.
TI model libraries can be accessed directly from Component Explorer in OrCAD X Capture. Right-click TI-PSpice under Workspace Configuration and choose Show Component Explorer. Requires a valid OrCAD X Cloud subscription.
The metal density scan procedure is enhanced to improve density analysis between two regions on the same layer.
A new quick report has been added and provides conductor lengths within a selected region across all layers. This information helps quickly understand how much routing lies inside or outside a region. It also provides automatic, clear labels indicating how nested or overlapping regions are handled.