SystemCapture
Unified Cockpit- Layout Editing
With this unified cockpit designers can seamlessly edit, plan, and modify the PCB layout with the easy-to-use X Layout platform directly in System Capture. This change enhances collaboration between the schematic and PCB layout and incorporates additional features such as preferences and constraints to help communicate design intent upfront.
System-Level Design Enhancements
The System Capture system-level design workflow is upgraded to improve complex multi-board project handling and design reusability. Key enhanced features include:
- Multi-Page Logical Board Placement: You can now place parts of the same logical board on different schematic pages and use the same logical block multiple times in other parts of the design.
- Ignore Subsystem Option: A context menu, Ignore Subsystem, has been introduced to exclude specific subsystems from system-level connectivity checks and report generation.
Navigation Links Reports
System Capture now supports generating navigation link reports, also called cross-references or CRef reports. Reports for Nets by Page, Base Net, Pin Cross-References, CRef parts, and Synonyms can now be created to be viewed in the schematic or exported as text files. These reports provide detailed connectivity and component cross-referencing insights to help quickly analyze design relationships and locate elements across pages and blocks.
Duplicate Cell Support
System Capture designs now handle cells with the same names across libraries. To support this enhancement, physical part names are modified to avoid conflicts.
SnapMagic Integration
SnapMagic is now available in Unified Search to expand the list of available components. The SnapMagic parts database can be accessed without leaving System Capture.
Run Electrical Stress Analysis on Selected IC
You can now run electrical stress analysis on a specific device such as an IC, connector, DC-DC/LDO, or mechanical device.
Workflow Manager for Electrical Overstress Analysis
A new workflow to streamline electrical stress analysis has been introduced. The EOS workflow can be accessed under View > Analysis Workflows > Electrical Stress.
Analyze Pre-Layout and Post-Layout Power Topology Analysis
Separate dashboards to analyze pre-layout and post-layout power topology analysis results are now available.
Variant Schematic Previews in Pulse Web Dashboard
The Pulse web dashboard now supports design variants. To choose a variant, open the Schematic tab and select the Variant dropdown. This enhancement allows designers to switch between variants and easily review or download them.
Design Search and Version Control Enhancements
System Capture and the Pulse web dashboard have enhanced design search and version control capabilities. These include:
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- The MATCHES column shows BOM-Only Components and Variant Components for design search results.
- Version control for designs and blocks is available in the Design tab of Unified Search.
- A new filter called Reuse From has been introduced. This filter shows the source of the design block that is reused.
- A new Reuse section has been added to the project Details tab. This section provides quick access to details of an imported block. This section shows key information for the block plus version information.
- The Version Control window now supports version management at the block and page levels.
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Local Library Support
With the new Local Library feature, create and manage libraries directly on your computer. With this new feature, a pulse server connection is not required, all symbols are edited and stored locally with complete formatting support. Anyone can author these local libraries and no role-based restrictions apply. Additionally, custom shapes from managed libraries can be reused and importing pin lists for faster symbol creation is available.
Custom Verification Rules
Validation rules now offer enhanced customization for system-defined rules, with the ability to specify the object stages in which they run, such as Validate, Check-in, Pre-Release, and Release. User-defined rules can now be created for all library object types, beyond libraries, parts, symbols, and footprints.
Multi-Package Support
Multi-package support is now available for library symbols. Multi-packages are symbols with the same number of pins but different pin configurations. A sectioned symbol, such as a 4-pin symbol split into four single-pin sections, is also considered a package. This new feature helps to manage different package variants of the same component.
Export Library CAD Data
In the Collaboration mode, export CAD data including logical library data, such as symbols and parts; and additional library data, such as PCB models, other models, datasheets, and 3D models.
Performance and Efficiency Improvements
In this release, speed and resource optimizations are available including faster handling of large designs with more than 100k component instances, reduced run-time memory usage for variants yielding up to 4× speed improvement in test conditions and reduced installation size and memory footprint for standalone System Capture with no impact on the product functionality.
New IDA Workflows
The DC Resistance and Topology Extraction workflows have been added to the IDA workflow list for direct access within System Capture.
Decap Simulations
Based on the target IC impedance, estimate and place decoupling capacitors at the schematic stage. A target impedance section is added to the Add Bypass Capacitors and Change Capacitor Quantity windows.
Usability Enhancements
Several usability enhancements have been added in this release of system capture including full-screen canvas editing, navigation option in the search results, active item tracking, pasting images, search field available in tabs, and more.
New Subcategories for IC Instances
The new subcategories are supported for ICs including Digital IC, Analog and Mixed Signal IC, DRAM, SRAM, Processors and Controllers, Memory, and Programmable Gate Arrays.
USER_FIT Parameter
The USER_FIT parameter is now available to calculate MTBF. This parameter is supported for the FIDES standard.
Categorized EOS and Audit Parameters for IC Pin Properties
The IC Pin Properties section of the Electrical Stress Settings dialog box now has separate categories for EOS and audit parameters. The EOS parameters now include amplitude (V), pulse width, time period, frequency, and delay.
Importing Unmanaged Library Data to Pulse Server
All published data in an Allegro X Managed Library database, including data objects, can be imported into Pulse.
Modifying Templates for Library Objects
Templates for parts, manufacturers, MPNs, and symbols can be updated even after they are created, allowing adjustments to existing library objects.
A new solution, Allegro X Managed Library (AML), for centralized library authoring, data management, and enterprise collaboration has been introduced in this release for Allegro System Capture. AML standardizes workflows, ensures data consistency, and streamlines the PCB design process in a scalable environment integrated with Pulse.
This release introduces positive masks, an enhancement for mask layer visualization and manufacturability. Traditionally, mask layers are negative, where the visible objects on the canvas represent openings in the mask. The traditional approach requires designers to mentally invert the image to understand the manufactured outcome. Interpreting these negative mask visuals as positive during 3D rendering or manufacturability checks can be counterintuitive and error-prone, adding complexity to the design and review process.
This update modernizes the way text is managed in PCB designs, aligning the tool with industry-standard applications. You now have the flexibility to choose from a wide range of fonts that reflect personal or corporate branding while also improving the visual clarity and consistency of design documentation. In addition to standard fonts, the Mooretronics font is also supported within layout editors.
The docked Constraint Manager is a new Constraints panel that simplifies the process of assigning and visualizing constraints directly from the Layout Editor user interface. It presents constraints in a graphical format and organizes them under Basic and Advanced modes. Constraints can be controlled at the group level rather than the net level by assigning constraint sets at the net group, net class, and differential pair levels within the Object Hierarchy panel.
The Search panel is a new dockable panel that allows you to instantly query database objects and cross-probe them from the canvas or panel to find information and objects quickly. This provides on-demand content loading to reduce memory usage and improve performance, real-time updates to ensure you have access to the latest information, and custom column filtering to allow columns to be rearranged as needed.
The Reports panel is a new dockable panel that automatically loads selected Quick Reports for easier review and canvas navigation. This panel eliminates the need to manage a separate floating report viewer for the Shape Islands Report, Unassigned Shapes Report, Missing Teardrops Report, Missing Tapers Report, and the Dangling Traces, Vias, and Antenna report.
25.1 introduces a new dialog box, Differential Pair Automatic Setup, which provides a unified solution for generating differential pairs. This dialog box combines all unique features in the existing solutions available within and outside the Constraint Manager and simplifies the process of generating differential pairs.
Smart Search is a new search engine that generates predictions based on entered keywords or questions to find the information you need to complete a task directly in the layout. This feature is useful when modifying the design by applying object properties or setting user preferences while working on it.
A new configuration-based solution defines all required data exports and manages export parameters in a single dialog box. It eliminates the need to explore different areas of the layout editor to produce manufacturing exports.
The enhanced pin delay import feature provides auto-detection, column and cell validation, and the ability to adjust column categories and values directly within the dialog box without modifying the source CSV file. The enhanced functionality queries the database to flag missing Reference Designator and Pin Number combinations in the design and allows selective import by deactivating rows and columns as required.
The metal density scan command, used to perform metal density analysis of design layers, is enhanced for performance. The command also provides additional metal density checks and options to meet manufacturing requirements such as minimum/maximum metal density across layers and metal density difference between two layers.
In this release, Cadence continues to expand the capabilities of 3DX Canvas, helping designers visualize their PCB layouts in a highly realistic 3D environment before sending the layouts to manufacturing. 3DX Canvas has been enhanced to selectively display and incrementally add objects to the 3DX Canvas, making the environment far more interactive and efficient. You can now highlight selected objects in the 3DX canvas from the PCB, cross-probe objects, and adjust the 3D view automatically.
Allegro X PCB Editor has several performance enhancements added included DRCs, import and export of design data, placement and interactive placement, routing and interactive routing, dynamic shapes, padstack refresh, 3D view, and in-design analysis.
Review a schematic design using comments and markups. Mark any area in the design canvas using rectangular or arrow markups and add text comments in for efficient design reviews.
The settings of a design template can now be saved as a .dtp file and loaded to reuse in a design. Save and load templates for later reuse in schematic designs allowing you to quickly configure design properties such as text font and size.