SystemCapture
Unified Cockpit- Layout Editing
With this unified cockpit designers can seamlessly edit, plan, and modify the PCB layout with the easy-to-use X Layout platform directly in System Capture. This change enhances collaboration between the schematic and PCB layout and incorporates additional features such as preferences and constraints to help communicate design intent upfront.
System-Level Design Enhancements
The System Capture system-level design workflow is upgraded to improve complex multi-board project handling and design reusability. Key enhanced features include:
- Multi-Page Logical Board Placement: You can now place parts of the same logical board on different schematic pages and use the same logical block multiple times in other parts of the design.
- Ignore Subsystem Option: A context menu, Ignore Subsystem, has been introduced to exclude specific subsystems from system-level connectivity checks and report generation.
Navigation Links Reports
System Capture now supports generating navigation link reports, also called cross-references or CRef reports. Reports for Nets by Page, Base Net, Pin Cross-References, CRef parts, and Synonyms can now be created to be viewed in the schematic or exported as text files. These reports provide detailed connectivity and component cross-referencing insights to help quickly analyze design relationships and locate elements across pages and blocks.
Duplicate Cell Support
System Capture designs now handle cells with the same names across libraries. To support this enhancement, physical part names are modified to avoid conflicts.
SnapMagic Integration
SnapMagic is now available in Unified Search to expand the list of available components. The SnapMagic parts database can be accessed without leaving System Capture.
Run Electrical Stress Analysis on Selected IC
You can now run electrical stress analysis on a specific device such as an IC, connector, DC-DC/LDO, or mechanical device.
Workflow Manager for Electrical Overstress Analysis
A new workflow to streamline electrical stress analysis has been introduced. The EOS workflow can be accessed under View > Analysis Workflows > Electrical Stress.
Analyze Pre-Layout and Post-Layout Power Topology Analysis
Separate dashboards to analyze pre-layout and post-layout power topology analysis results are now available.
Variant Schematic Previews in Pulse Web Dashboard
The Pulse web dashboard now supports design variants. To choose a variant, open the Schematic tab and select the Variant dropdown. This enhancement allows designers to switch between variants and easily review or download them.
Design Search and Version Control Enhancements
System Capture and the Pulse web dashboard have enhanced design search and version control capabilities. These include:
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- The MATCHES column shows BOM-Only Components and Variant Components for design search results.
- Version control for designs and blocks is available in the Design tab of Unified Search.
- A new filter called Reuse From has been introduced. This filter shows the source of the design block that is reused.
- A new Reuse section has been added to the project Details tab. This section provides quick access to details of an imported block. This section shows key information for the block plus version information.
- The Version Control window now supports version management at the block and page levels.
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Local Library Support
With the new Local Library feature, create and manage libraries directly on your computer. With this new feature, a pulse server connection is not required, all symbols are edited and stored locally with complete formatting support. Anyone can author these local libraries and no role-based restrictions apply. Additionally, custom shapes from managed libraries can be reused and importing pin lists for faster symbol creation is available.
Custom Verification Rules
Validation rules now offer enhanced customization for system-defined rules, with the ability to specify the object stages in which they run, such as Validate, Check-in, Pre-Release, and Release. User-defined rules can now be created for all library object types, beyond libraries, parts, symbols, and footprints.
Multi-Package Support
Multi-package support is now available for library symbols. Multi-packages are symbols with the same number of pins but different pin configurations. A sectioned symbol, such as a 4-pin symbol split into four single-pin sections, is also considered a package. This new feature helps to manage different package variants of the same component.
Export Library CAD Data
In the Collaboration mode, export CAD data including logical library data, such as symbols and parts; and additional library data, such as PCB models, other models, datasheets, and 3D models.
Performance and Efficiency Improvements
In this release, speed and resource optimizations are available including faster handling of large designs with more than 100k component instances, reduced run-time memory usage for variants yielding up to 4× speed improvement in test conditions and reduced installation size and memory footprint for standalone System Capture with no impact on the product functionality.
New IDA Workflows
The DC Resistance and Topology Extraction workflows have been added to the IDA workflow list for direct access within System Capture.
Decap Simulations
Based on the target IC impedance, estimate and place decoupling capacitors at the schematic stage. A target impedance section is added to the Add Bypass Capacitors and Change Capacitor Quantity windows.
Usability Enhancements
Several usability enhancements have been added in this release of system capture including full-screen canvas editing, navigation option in the search results, active item tracking, pasting images, search field available in tabs, and more.
New Subcategories for IC Instances
The new subcategories are supported for ICs including Digital IC, Analog and Mixed Signal IC, DRAM, SRAM, Processors and Controllers, Memory, and Programmable Gate Arrays.
USER_FIT Parameter
The USER_FIT parameter is now available to calculate MTBF. This parameter is supported for the FIDES standard.
Categorized EOS and Audit Parameters for IC Pin Properties
The IC Pin Properties section of the Electrical Stress Settings dialog box now has separate categories for EOS and audit parameters. The EOS parameters now include amplitude (V), pulse width, time period, frequency, and delay.
Importing Unmanaged Library Data to Pulse Server
All published data in an Allegro X Managed Library database, including data objects, can be imported into Pulse.
Modifying Templates for Library Objects
Templates for parts, manufacturers, MPNs, and symbols can be updated even after they are created, allowing adjustments to existing library objects.