25.1.3
SystemCapture
Design Comparison Dashboard
When you compare two design versions through the Project Explorer or the Version Control dialog in Allegro X System Capture, a new Comparison dashboard provides a visual overview of differences between design versions. This dashboard is available in both Individual Mode and Collaboration Mode and offers two ways to add differences:
- Tree view: organizes changes by design hierarchy, helping you navigate blocks and locate modifications within the design structure
- Flat: displays all detected differences in a single list for quick scanning
Enhanced Cross-Functional Workflow for Power Module Designs
This release introduces an enhanced simulation workflow in the System Capture environment to support Power Module design analysis. With this workflow, you can:
- Create dedicated simulation schematics directly from implementation schematics.
- Select specific regions of the design for simulation.
- Annotate designs with parasitic models using external .ckt files.
- Automatically translate required libraries during workflow setup.
- Automatically generate symbols for simulation components.
- Correctly map ports and pins between schematic components and parasitic blocks.
The metal density scan procedure is enhanced to improve density analysis between two regions on the same layer.
A new quick report has been added and provides conductor lengths within a selected region across all layers. This information helps quickly understand how much routing lies inside or outside a region. It also provides automatic, clear labels indicating how nested or overlapping regions are handled.
The metal density scan has been enhanced with polygon-based region selection which also supports voids. To improve usability, scan region labels now specify the shape type, rectangular or polygonal, and related option names are clearer.
Simplify design reusing by replacing file-based methods and place replicate methods with a direct clipboard-based workflow. You can now copy placement, routing, vias, and shapes between designs without intermediate files, saving time and accelerating design cycles. This method includes intelligent mapping for a seamless transition. Upon pasting, a dialog box guides you through the correct integration of the copied layout into the target design.
The status command dialog box has been updated with new fields, providing enhanced visibility and control over the status of design shapes. This includes:
Snapping control has been enhanced and snapping configuration simplified. A new keyboard shortcut has been added to toggle snapping and snapping cursor display without leaving the layout editor, reducing workflow interruptions. A new All check box to activate snapping for all objects has been added, streamlining snapping configuration.
With this release, OrCAD X Presto introduces the ability to perform instant fanout on multiple pins. Draw a window around a group of pins to select them to perform the instant fanout.
With this unified cockpit designers can seamlessly edit, plan, and modify the PCB layout with the easy-to-use X Layout platform directly in System Capture. This change enhances collaboration between the schematic and PCB layout and incorporates additional features such as preferences and constraints to help communicate design intent upfront.
System Capture now supports generating navigation link reports, also called cross-references or CRef reports. Reports for Nets by Page, Base Net, Pin Cross-References, CRef parts, and Synonyms can now be created to be viewed in the schematic or exported as text files. These reports provide detailed connectivity and component cross-referencing insights to help quickly analyze design relationships and locate elements across pages and blocks.
SnapMagic is now available in Unified Search to expand the list of available components. The SnapMagic parts database can be accessed without leaving System Capture.
A new workflow to streamline electrical stress analysis has been introduced. The EOS workflow can be accessed under View > Analysis Workflows > Electrical Stress.
The Pulse web dashboard now supports design variants. To choose a variant, open the Schematic tab and select the Variant dropdown. This enhancement allows designers to switch between variants and easily review or download them.
System Capture and the Pulse web dashboard have enhanced design search and version control capabilities. These include:
With the new Local Library feature, create and manage libraries directly on your computer. With this new feature, a pulse server connection is not required, all symbols are edited and stored locally with complete formatting support. Anyone can author these local libraries and no role-based restrictions apply. Additionally, custom shapes from managed libraries can be reused and importing pin lists for faster symbol creation is available.
Validation rules now offer enhanced customization for system-defined rules, with the ability to specify the object stages in which they run, such as Validate, Check-in, Pre-Release, and Release. User-defined rules can now be created for all library object types, beyond libraries, parts, symbols, and footprints.
The DC Resistance and Topology Extraction workflows have been added to the IDA workflow list for direct access within System Capture.
Based on the target IC impedance, estimate and place decoupling capacitors at the schematic stage. A target impedance section is added to the Add Bypass Capacitors and Change Capacitor Quantity windows.
The new subcategories are supported for ICs including Digital IC, Analog and Mixed Signal IC, DRAM, SRAM, Processors and Controllers, Memory, and Programmable Gate Arrays.
The USER_FIT parameter is now available to calculate MTBF. This parameter is supported for the FIDES standard.
The IC Pin Properties section of the Electrical Stress Settings dialog box now has separate categories for EOS and audit parameters. The EOS parameters now include amplitude (V), pulse width, time period, frequency, and delay.
All published data in an Allegro X Managed Library database, including data objects, can be imported into Pulse.
PSpice now supports advanced built-in functions to model memristors. The new models are included in the memristor.olb library.
PSpice now supports sweeping of components models to perform design exploration with different models in a single simulation run. Evaluate different models for a given base model and compare them to see how the circuit behavior changes for different models.
This release introduces positive masks, an enhancement for mask layer visualization and manufacturability. Traditionally, mask layers are negative, where the visible objects on the canvas represent openings in the mask. The traditional approach requires designers to mentally invert the image to understand the manufactured outcome. Interpreting these negative mask visuals as positive during 3D rendering or manufacturability checks can be counterintuitive and error-prone, adding complexity to the design and review process.
This update modernizes the way text is managed in PCB designs, aligning the tool with industry-standard applications. You now have the flexibility to choose from a wide range of fonts that reflect personal or corporate branding while also improving the visual clarity and consistency of design documentation. In addition to standard fonts, the Mooretronics font is also supported within layout editors.
The docked Constraint Manager is a new Constraints panel that simplifies the process of assigning and visualizing constraints directly from the Layout Editor user interface. It presents constraints in a graphical format and organizes them under Basic and Advanced modes. Constraints can be controlled at the group level rather than the net level by assigning constraint sets at the net group, net class, and differential pair levels within the Object Hierarchy panel.
The Search panel is a new dockable panel that allows you to instantly query database objects and cross-probe them from the canvas or panel to find information and objects quickly. This provides on-demand content loading to reduce memory usage and improve performance, real-time updates to ensure you have access to the latest information, and custom column filtering to allow columns to be rearranged as needed.
Smart Search is a new search engine that generates predictions based on entered keywords or questions to find the information you need to complete a task directly in the layout. This feature is useful when modifying the design by applying object properties or setting user preferences while working on it.
A new configuration-based solution defines all required data exports and manages export parameters in a single dialog box. It eliminates the need to explore different areas of the layout editor to produce manufacturing exports.
The enhanced pin delay import feature provides auto-detection, column and cell validation, and the ability to adjust column categories and values directly within the dialog box without modifying the source CSV file. The enhanced functionality queries the database to flag missing Reference Designator and Pin Number combinations in the design and allows selective import by deactivating rows and columns as required.
In this release, Cadence continues to expand the capabilities of 3DX Canvas, helping designers visualize their PCB layouts in a highly realistic 3D environment before sending the layouts to manufacturing. 3DX Canvas has been enhanced to selectively display and incrementally add objects to the 3DX Canvas, making the environment far more interactive and efficient. You can now highlight selected objects in the 3DX canvas from the PCB, cross-probe objects, and adjust the 3D view automatically.
OrCAD X PCB Editor has several performance enhancements added included DRCs, import and export of design data, placement and interactive placement, routing and interactive routing, dynamic shapes, padstack refresh, 3D view, and in-design analysis.
The Reports panel is a new dockable panel that automatically loads selected Quick Reports for easier review and canvas navigation. This panel eliminates the need to manage a separate floating report viewer for the Shape Islands Report, Unassigned Shapes Report, Missing Teardrops Report, Missing Tapers Report, and the Dangling Traces, Vias, and Antenna report.
25.1 introduces a new dialog box, Differential Pair Automatic Setup, which provides a unified solution for generating differential pairs. This dialog box combines all unique features in the existing solutions available within and outside the Constraint Manager and simplifies the process of generating differential pairs.
The metal density scan command, used to perform metal density analysis of design layers, is enhanced for performance. The command also provides additional metal density checks and options to meet manufacturing requirements such as minimum/maximum metal density across layers and metal density difference between two layers.